IJIRCST

Volume- 12
Issue- 3
Year- 2024

Enhancing Laboratory Experience: A Combination of RFID and Machine Learning Techniques to Track Attendance and Upgrade Hardware

Prasanna Kumar M | Likhith K Raj | Karthik M | Chandu Shivaputrappa Barker | Manoj R

DOI: 10.55524/ijircst.2024.12.3.18 | DOI URL: https://doi.org/10.55524/ijircst.2024.12.3.18 Crossref

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (CC BY 4.0) (http://creativecommons.org/licenses/by/4.0)

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